"Delay fault testing and silicon debug using scan chains."

Ramyanshu Datta, Antony Sebastine, Jacob A. Abraham (2004)

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DOI: 10.1109/ETSYM.2004.1347600

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ramyanshu Datta, Antony Sebastine, Jacob A. Abraham:
Delay fault testing and silicon debug using scan chains. ETS 2004: 46-51

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