"Data-Driven Bed of Nails Wear Analysis for the in-Circuit-Testing of ..."

Till Sindel et al. (2024)

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DOI: 10.1109/ETFA61755.2024.10710880

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-30

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Till Sindel, Nils Thielen, Felix Mahr, Tobias Reichenstein, Hüseyin Erdogan, Jörg Franke:
Data-Driven Bed of Nails Wear Analysis for the in-Circuit-Testing of Electronic Modules. ETFA 2024: 1-6

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