"Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI ..."

Christoforos G. Theodorou et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343401

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Franck Arnaud, Jalal Jomaah, Charalambos A. Dimitriadis, Gérard Ghibaudo:
Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs. ESSDERC 2012: 334-337

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