"Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash ..."

Shun Suzuki et al. (2018)

> Home

Details and statistics

DOI: 10.1109/ESSDERC.2018.8486914

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/essderc/SuzukiDNT18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/SuzukiDNT18
Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura, Ken Takeuchi:
Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash Memories to Suppress Both Lateral Charge Migration and Vertical Charge De-trap and Increase Data-retention Time by 2.7x. ESSDERC 2018: 150-153

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.