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"On the fly characterization of charge trapping phenomena at GaN/dielectric ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Roberta Stradiotto et al. (2015)

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DOI: 10.1109/ESSDERC.2015.7324716

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  - https://dblp.org/rec/conf/essderc/StradiottoPOG15
Roberta Stradiotto, Gregor Pobegen, Clemens Ostermaier, Tibor Grasser:
On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements. ESSDERC 2015: 72-75

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