"Qualitative assessment of epitaxial graphene FETs on SiC substrates via ..."

C. Mukherjee et al. (2014)

> Home

Details and statistics

DOI: 10.1109/ESSDERC.2014.6948821

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/essderc/MukherjeeFZMHM14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/MukherjeeFZMHM14
C. Mukherjee, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, David Mele:
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation. ESSDERC 2014: 305-308

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.