"Localization and analysis of surface charges trapped in AlGaN/GaN HEMTs ..."

Lars Heuken et al. (2018)

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DOI: 10.1109/ESSDERC.2018.8486910

access: closed

type: Conference or Workshop Paper

metadata version: 2019-04-30

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Lars Heuken, Muhammad Alshahed, Alessandro Ottaviani, Mohammed Alomari, Joachim N. Burghartz, Ulrike Waizmann, Thomas Reindl:
Localization and analysis of surface charges trapped in AlGaN/GaN HEMTs using multiple secondary MIS gates. ESSDERC 2018: 22-25

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