"Variability in device degradations: Statistical observation of NBTI for ..."

Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato (2014)

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DOI: 10.1109/ESSDERC.2014.6948799

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato:
Variability in device degradations: Statistical observation of NBTI for 3996 transistors. ESSDERC 2014: 218-221

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