"FEOL/BEOL wear-out estimator using stress-to-frequency conversion of ..."

Kan Takeuchi et al. (2016)

> Home

Details and statistics

DOI: 10.1109/ESSCIRC.2016.7598293

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/esscirc/TakeuchiSOSNT16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/esscirc/TakeuchiSOSNT16
Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya:
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. ESSCIRC 2016: 265-268

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.