"Characterization and modeling of electrical stresses on digital integrated ..."

Alexandre Boyer, Sonia Ben Dhia (2013)

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DOI: 10.1109/EMCCOMPO.2013.6735199

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-12

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Alexandre Boyer, Sonia Ben Dhia:
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. EMC Compo 2013: 190-195

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