"Robust classification of DNA damage patterns in single cell gel ..."

Taehoon Lee et al. (2013)

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DOI: 10.1109/EMBC.2013.6610338

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-21

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Taehoon Lee, Sungmin Lee, Woo Young Sim, Yu Mi Jung, Sunmi Han, Chanil Chung, Jay Junkeun Chang, Hyeyoung Min, Sungroh Yoon:
Robust classification of DNA damage patterns in single cell gel electrophoresis. EMBC 2013: 3666-3669

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