"Defects Recognition on Wafer Maps Using Multilayer Feed-Forward Neural ..."

Radoslav Strba, Daniela Bordencea (2020)

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DOI: 10.3233/FAIA200828

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-27

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  dblp key:
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Radoslav Strba, Daniela Bordencea:
Defects Recognition on Wafer Maps Using Multilayer Feed-Forward Neural Network. EJC 2020: 174-186

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