"Polarized light scanning for cultural heritage investigation."

Jay Arre Toque et al. (2011)

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DOI: 10.1117/12.876590

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-08

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  - conf/ei-cvaa/ToqueMMI11
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Jay Arre Toque, Yusuke Murayama, Yohei Matsumoto, Ari Ide-Ektessabi:
Polarized light scanning for cultural heritage investigation. Computer Vision and Image Analysis of Art 2011: 78690N

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