"Solving test suite reduction problem using greedy and genetic algorithms."

Ali Yamuc et al. (2017)

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DOI: 10.1109/ECAI.2017.8166445

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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  - conf/ecai2/YamucCBK17
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  - https://dblp.org/rec/conf/ecai2/YamucCBK17
Ali Yamuc, M. Özgür Cingiz, Göksel Biricik, Oya Kalipsiz:
Solving test suite reduction problem using greedy and genetic algorithms. ECAI 2017: 1-5

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