"Achieving Complete Structural Test Coverage in Embedded Systems Using ..."

Alexander Weiss et al. (2024)

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DOI: 10.4230/OASICS.DX.2024.19

access: open

type: Conference or Workshop Paper

metadata version: 2024-11-26

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Alexander Weiss, Albert Schulz, Martin Heininger, Martin Sachenbacher, Martin Leucker:
Achieving Complete Structural Test Coverage in Embedded Systems Using Trace-Based Monitoring (Short Paper). DX 2024: 19:1-19:12

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