"Testing for Intermittent Resistive Faults in CMOS Integrated Systems."

Hassan Ebrahimi, Hans G. Kerkhoff (2016)

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DOI: 10.1109/DSD.2016.58

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Hassan Ebrahimi, Hans G. Kerkhoff:
Testing for Intermittent Resistive Faults in CMOS Integrated Systems. DSD 2016: 703-707

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