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"Industrial Defect Detection Through Computer Vision: A Survey."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Yunjie Tang et al. (2022)

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DOI: 10.1109/DSC55868.2022.00091

access: closed

type: Conference or Workshop Paper

metadata version: 2026-07-26

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  dblp key:
  - conf/dsc/TangSZLJC22
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  persistent URL:
  - https://dblp.org/rec/conf/dsc/TangSZLJC22
Yunjie Tang, Kai Sun, Danhuai Zhao, Yan Lu, Jiaju Jiang, Hong Chen:
Industrial Defect Detection Through Computer Vision: A Survey. DSC 2022: 605-610

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