"CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity."

Junrui Zhang et al. (2018)

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DOI: 10.1109/DRC.2018.8442197

access: closed

type: Conference or Workshop Paper

metadata version: 2025-02-04

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Junrui Zhang, Francesco Bellando, Maneesha Rupakula, Erick Garcia Cordero, N. Ebejer, Johan Longo, Fabien Wildhaber, Hoel Guerin, Adrian Mihai Ionescu:
CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity. DRC 2018: 1-2

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