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"Resistive Switching Early Failure and Gap Identification in Bilayer ..."
Ying-Chen Chen et al. (2019)
- Ying-Chen Chen, Szu-Tung Hu, Chao-Cheng Lin, Jack C. Lee:

Resistive Switching Early Failure and Gap Identification in Bilayer Selectorless RRAM Applications. DRC 2019: 89-90

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