"Investigation of Mean-Error Metrics for Testing Approximate Integrated ..."

Marcello Traiola et al. (2018)

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DOI: 10.1109/DFT.2018.8602939

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio:
Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits. DFT 2018: 1-6

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