"Automated Generation of Built-In Self-Test and Measurement Circuitry for ..."

George J. Starr et al. (2009)

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DOI: 10.1109/DFT.2009.43

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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George J. Starr, Jie Qin, Bradley F. Dutton, Charles E. Stroud, Foster F. Dai, Victor P. Nelson:
Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems. DFT 2009: 11-19

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