"Memory Dynamic Faults and Array-Level Faults Detector in Digital Test ..."

D. Ronga et al. (2025)

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DOI: 10.1109/DFT66274.2025.11257447

access: closed

type: Conference or Workshop Paper

metadata version: 2026-01-13

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D. Ronga, Eric Faehn, Patrick Girard, Arnaud Virazel:
Memory Dynamic Faults and Array-Level Faults Detector in Digital Test Environment. DFT 2025: 1-6

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