"Effects of Voltage and Temperature Variations on the Electrical Masking ..."

Semiu A. Olowogemo, William H. Robinson, Daniel B. Limbrick (2018)

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DOI: 10.1109/DFT.2018.8602975

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Semiu A. Olowogemo, William H. Robinson, Daniel B. Limbrick:
Effects of Voltage and Temperature Variations on the Electrical Masking Capability of Sub-65 nm Combinational Logic Circuits. DFT 2018: 1-6

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