"Analysis and Testing of Analog and Mixed-Signal Circuits by an ..."

Yukiya Miura, Daisuke Kato (2003)

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DOI: 10.1109/DFTVS.2003.1250122

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yukiya Miura, Daisuke Kato:
Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model: A Case Study of Application and Implementation. DFT 2003: 279-286

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