"A Probabilistic Measurement for Totally Self-Checking Circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Jien-Chung Lo, Eiji Fujiwara (1993)

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DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2003-01-27

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  dblp key:
  - conf/dft/LoF93
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  persistent URL:
  - https://dblp.org/rec/conf/dft/LoF93
Jien-Chung Lo, Eiji Fujiwara:
A Probabilistic Measurement for Totally Self-Checking Circuits. DFT 1993: 263-270

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