"Soft Error Hardened Latch Scheme for Enhanced Scan Based Delay Fault Testing."

Takashi Ikeda, Kazuteru Namba, Hideo Ito (2007)

> Home

Details and statistics

DOI: 10.1109/DFT.2007.44

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/dft/IkedaNI07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/IkedaNI07
Takashi Ikeda, Kazuteru Namba, Hideo Ito:
Soft Error Hardened Latch Scheme for Enhanced Scan Based Delay Fault Testing. DFT 2007: 282-290

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.