"A Low Power Oriented Multiple Target Test Generation Method for 2-Cycle ..."

Toshinori Hosokawa et al. (2024)

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DOI: 10.1109/DFT63277.2024.10753554

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-02

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Toshinori Hosokawa, Momona Mizota, Masayoshi Yoshimura, Masayuki Arai:
A Low Power Oriented Multiple Target Test Generation Method for 2-Cycle Gate-Exhaustive Faults. DFT 2024: 1-6

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