"A dynamic test compaction method on low power test generation based on ..."

Toshinori Hosokawa et al. (2017)

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DOI: 10.1109/DFT.2017.8244463

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/HosokawaHYA17
Toshinori Hosokawa, Atsushi Hirai, Hiroshi Yamazaki, Masayuki Arai:
A dynamic test compaction method on low power test generation based on capture safe test vectors. DFT 2017: 1-6

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