"Repair Yield Simulation with Iterative Critical Area Analysis for ..."

Yuichi Hamamura et al. (2002)

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DOI: 10.1109/DFTVS.2002.1173527

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yuichi Hamamura, Kazunori Nemoto, Takaaki Kumazawa, Hisafumi Iwata, Kousuke Okuyama, Shiro Kamohara, Aritoshi Sugimoto:
Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure. DFT 2002: 305-313

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