"Characterization of data retention faults in DRAM devices."

Angelo Bacchini et al. (2014)

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DOI: 10.1109/DFT.2014.6962069

access: closed

type: Conference or Workshop Paper

metadata version: 2026-04-07

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Angelo Bacchini, Marco Rovatti, Gianluca Furano, Marco Ottavi:
Characterization of data retention faults in DRAM devices. DFT 2014: 9-14

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