"Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels."

Abdelaziz Ammari et al. (2003)

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DOI: 10.1109/DFTVS.2003.1250129

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Abdelaziz Ammari, Régis Leveugle, Matteo Sonza Reorda, Massimo Violante:
Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels. DFT 2003: 336-343

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