"Concurrent testing of VLSI digital signal processors using mutation based ..."

Chouki Aktouf, Ghassan Al Hayek, Chantal Robach (1997)

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DOI: 10.1109/DFTVS.1997.628314

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chouki Aktouf, Ghassan Al Hayek, Chantal Robach:
Concurrent testing of VLSI digital signal processors using mutation based testing. DFT 1997: 94-99

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