"AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis."

M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre (2008)

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DOI: 10.1109/DELTA.2008.86

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/delta/DoulcierFR08
M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis. DELTA 2008: 314-321

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