"A new hierarchical built-in self-test with on-chip diagnosis for VLIW ..."

Markus Ulbricht et al. (2011)

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DOI: 10.1109/DDECS.2011.5783067

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Markus Ulbricht, Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus:
A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors. DDECS 2011: 143-146

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