"Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation."

Özgür Ozan Yilmaz, Melahat Bilge Demirköz, Müstak Erhan Yalçin (2024)

> Home

Details and statistics

DOI: 10.1109/DCIS62603.2024.10769157

access: closed

type: Conference or Workshop Paper

metadata version: 2026-02-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dcis/YilmazDY24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dcis/YilmazDY24
Özgür Ozan Yilmaz, Melahat Bilge Demirköz, Müstak Erhan Yalçin:
Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation. DCIS 2024: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.