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"Sequential Circuit Test Generation Using Decision Diagram Models."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Jaan Raik, Raimund Ubar (1999)

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DOI: 10.1109/DATE.1999.761212

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/date/RaikU99
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  persistent URL:
  - https://dblp.org/rec/conf/date/RaikU99
Jaan Raik, Raimund Ubar:
Sequential Circuit Test Generation Using Decision Diagram Models. DATE 1999: 736-740

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