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"Improving SRAM test quality by leveraging self-timed circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Josef Kinseher et al. (2016)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-09

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  - electronic edition @ ieee.org
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  dblp key:
  - conf/date/KinseherZPL16
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  persistent URL:
  - https://dblp.org/rec/conf/date/KinseherZPL16
Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger:
Improving SRAM test quality by leveraging self-timed circuits. DATE 2016: 984-989

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last updated on 2021-08-09 01:32 CEST by the dblp team

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