"Gradient importance sampling: An efficient statistical extraction ..."

Thomas Haine et al. (2018)

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DOI: 10.23919/DATE.2018.8342002

access: closed

type: Conference or Workshop Paper

metadata version: 2018-04-24

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Thomas Haine, Johan Segers, Denis Flandre, David Bol:
Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics. DATE 2018: 195-200

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