"EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits ..."

Mingjun Wang et al. (2025)

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DOI: 10.1109/DAC63849.2025.11132928

access: closed

type: Conference or Workshop Paper

metadata version: 2025-09-23

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Mingjun Wang, Hui Wang, Jianan Mu, Xinyu Zhang, Bin Sun, Yihan Wen, Zizhen Liu, Feng Gu, Jun Gao, Shengwen Liang, Jing Ye, Xiaowei Li, Huawei Li:
EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits via Strongly Connected Components. DAC 2025: 1-7

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