"iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS ..."

Yi-Kan Cheng et al. (1996)

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DOI: 10.1145/240518.240622

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang:
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. DAC 1996: 548-551

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