"HATBED: a distributed hardware assisted testbed for non-invasive profiling ..."

Yi Li, Junyan Ma, Te Zhang (2019)

> Home

Details and statistics

DOI: 10.1145/3312480.3313172

access: closed

type: Conference or Workshop Paper

metadata version: 2025-02-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/cpsweek/LiMZ19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/cpsweek/LiMZ19
Yi Li, Junyan Ma, Te Zhang:
HATBED: a distributed hardware assisted testbed for non-invasive profiling of IoT devices. Bench@CPSIoTWeek 2019: 13-17

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.