"Compact and behavioral modeling of transistors from NVNA measurements: New ..."

David E. Root et al. (2012)

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DOI: 10.1109/CICC.2012.6330642

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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David E. Root, Jianjun Xu, Franz Sischka, Mihai Marcu, Jason Horn, R. M. Biernacki, Masaya Iwamoto:
Compact and behavioral modeling of transistors from NVNA measurements: New flows and future trends. CICC 2012: 1-6

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