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"Range-Aware Deep Learning Framework for Multi-Parameter Electrical Test ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Jihyun Kim et al. (2025)

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DOI: 10.1109/CASE58245.2025.11164069

access: closed

type: Conference or Workshop Paper

metadata version: 2025-09-30

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  dblp key:
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Jihyun Kim, Sunhyeok Hwang, Jinyong Jeong, Jaehoon Jeong, Kyu-Baik Chang, Hanlim Choi, Suyeon Shon, Seoung Bum Kim:
Range-Aware Deep Learning Framework for Multi-Parameter Electrical Test Prediction in Semiconductor Manufacturing. CASE 2025: 1195-1200

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