"SEM Image Analysis for Quality Control of Nanoparticles."

Simon K. Alexander et al. (2009)

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DOI: 10.1007/978-3-642-03767-2_72

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-07

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Simon K. Alexander, Robert Azencott, Bernhard G. Bodmann, Ali Bouamrani, Ciro Chiappini, Mauro Ferrari, X. Liu, Ennio Tasciotti:
SEM Image Analysis for Quality Control of Nanoparticles. CAIP 2009: 590-597

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