"A self-test and self-repair approach for analog integrated circuits."

Mouna Karmani et al. (2012)

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DOI: 10.1109/BCFIC.2012.6217990

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  - https://dblp.org/rec/conf/bcfic/KarmaniKMKHR12
Mouna Karmani, Chiraz Khedhiri, Ka Lok Man, Tomas Krilavicius, Belgacem Hamdi, Amir-Mohammad Rahmani:
A self-test and self-repair approach for analog integrated circuits. BCFIC 2012: 117-120

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