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"Mixed-Signal SoC Testing: Is Mixed-Signal Design-for-Test on Its Way."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Chin-Long Wey et al. (2000)

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DOI: 10.1109/ATS.2000.10013

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  - https://dblp.org/rec/conf/ats/WeyOHN00
Chin-Long Wey, Adam Osseiran, José Luis Huertas, Yeon-Chen Nieu:
Mixed-Signal SoC Testing: Is Mixed-Signal Design-for-Test on Its Way. Asian Test Symposium 2000: 15

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