"Test Generation Of Analog Switched-Current Circuits."

Cheng-Ping Wang, Chin-Long Wey (1996)

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DOI: 10.1109/ATS.1996.555171

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Cheng-Ping Wang, Chin-Long Wey:
Test Generation Of Analog Switched-Current Circuits. Asian Test Symposium 1996: 276-281

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