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"Maximal Resilience for Reliability and Yield Enhancement in Interconnect ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Chih-Yun Pai, Katherine Shu-Min Li (2010)

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DOI: 10.1109/ATS.2010.53

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ats/PaiL10
Chih-Yun Pai, Katherine Shu-Min Li:
Maximal Resilience for Reliability and Yield Enhancement in Interconnect Structure. Asian Test Symposium 2010: 261-266

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