"Integrated Current Sensing Device for Micro IDDQ Test."

Koichi Nose, Takayasu Sakurai (1998)

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DOI: 10.1109/ATS.1998.741633

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Koichi Nose, Takayasu Sakurai:
Integrated Current Sensing Device for Micro IDDQ Test. Asian Test Symposium 1998: 323-326

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