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"Impact of All-Digital PLL on SoC Testing."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Toru Nakura, Tetsuya Iizuka, Kunihiro Asada (2012)

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DOI: 10.1109/ATS.2012.22

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/NakuraIA12
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  persistent URL:
  - https://dblp.org/rec/conf/ats/NakuraIA12
Toru Nakura, Tetsuya Iizuka, Kunihiro Asada:
Impact of All-Digital PLL on SoC Testing. Asian Test Symposium 2012: 252-257

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